Spectrometry apparatus, detection apparatus, and method for manufacturing spectrometry apparatus
AssigneeSeiko Epson Corporation
InventorsJun Amako, Kohei Yamada
Life of this patent
Estimating the term…
Loading patent…
AssigneeSeiko Epson Corporation
InventorsJun Amako, Kohei Yamada
Estimating the term…
A spectrometry apparatus includes a transmissive diffraction grating that transmits incident light. The transmissive diffraction grating has inclined surfaces made of a first dielectric material. The inclined surfaces are arranged so that they are inclined relative to a reference line. When the angle of incidence of light incident on the transmissive diffraction grating is measured with respect to the reference line and defined as an angle α, and the angle of diffraction of diffracted light is measured with respect to the reference line and defined as an angle β, the angle of incidence α is smaller than a Bragg angle θ defined with respect to the inclined surfaces, and the angle of diffraction β is greater than the Bragg angle θ.
A spectrometry apparatus comprising:
Dependencies are inferred from the claim text.