Semiconductor device including an active region and two layers having different stress characteristics

A semiconductor device comprising:

• an active region including a first channel region, wherein:
• the active region has a first edge abutting an isolation region, the first edge extending in a lateral direction and a second edge abutting the isolation region, the second edge extending in a transverse direction, wherein the second edge intersects the first edge;
• the first channel region lies at the first edge and is spaced apart from the second edge;
• and
• the first channel region extends in the transverse direction and the lateral direction;
• a first layer spaced apart from and not overlying the active region, having a boundary, and having a first stress and a corresponding stress type;
• and
• a second layer overlying the active region, and having a second stress that is less than the first stress or an opposite stress type from the corresponding stress type of the first stress,
• wherein from a top view and along the boundary of the first layer, the first layer extends away a first distance in the transverse direction from the second edge of the active region and the first layer extends away a second distance in the transverse direction from the first edge at the first channel region, wherein the first distance is smaller than the second distance.