Semiconductor device and manufacturing method thereof
AssigneeRenesas Electronics Corporation
InventorsKatsumi Morii, Yoshitaka Otsu, Kazuma Onishi, Tetsuya Nitta, Tatsuya Shiromoto, Shigeo Tokumitsu
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AssigneeRenesas Electronics Corporation
InventorsKatsumi Morii, Yoshitaka Otsu, Kazuma Onishi, Tetsuya Nitta, Tatsuya Shiromoto, Shigeo Tokumitsu
Estimating the term…
To provide a semiconductor device that can be manufactured using a simple process without ensuring a high embedding property; and a manufacturing method of the device. In the manufacturing method of the semiconductor device according to the invention, a semiconductor substrate having a configuration obtained by stacking a support substrate, a buried insulating film, and a semiconductor layer in order of mention is prepared first. Then, an element having a conductive portion is completed over the main surface of the semiconductor layer. A trench encompassing the element in a planar view and reaching the buried insulating film from the main surface of the semiconductor layer is formed. A first insulating film (interlayer insulating film) is formed over the element and in the trench to cover the element and form an air gap in the trench, respectively. Then, a contact hole reaching the conductive portion of the element is formed in the first insulating film.
A manufacturing method of a semiconductor device, comprising the steps of:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.