Apparatus and a method to test a parametric structure utilizing logical sensing

A system to test parametric properties, comprising:

• a device-under-test (DUT), comprising:
• a parametric structure operable to receive and transmit a logic signal;
• a power pin coupled to the parametric structure, wherein the power pin is operable to transfer the logic signal from the DUT;
• and
• a design-for-test (DFT) circuitry operable to gate the logic signal from the parametric structure to the power pin,
• a tester hardware that interfaces with the DUT and a tester, comprising:
• a channel operable to transfer the logic signal in the DUT;
• a power pathway operable to transfer power to the DUT;
• and
• a switch operable to enable multiplexing along one of the power pathway or the channel.

An integrated circuit (IC), comprising:

• a parametric structure operable to receive and transmit a logic signal;
• a power pin coupled to the parametric structure, wherein the power pin is operable to transfer the logic signal from the IC;
• and
• a design-for-test (DFT) circuitry operable to control a transistor that determines transferring of the logic signal from the parametric structure to the power pin.