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US 8,542,790 B2Granted
Jet pump inspection apparatus
AssigneeGE-Hitachi Nuclear Energy Americas LLC
InventorsRobert K. Dorosko, Jason Shawn Bates
Life of this patent
Estimating the term…
Abstract
Example embodiments are directed to jet pump inspection apparatuses including an encoded probe driver coupled to a guide funnel. In an example embodiment, the encoded probe driver and the guide funnel are located on the body of the apparatus in order to decrease the time required for inspection, thereby limiting exposure to personnel of radioactive contamination.
Claims19
A jet pump inspection apparatus comprising:
- a body;
- a probe driver configured to provide axial movement of a probe along a length of the apparatus;
- and
- a guide funnel configured to guide the probe into the apparatus to a given depth,
- wherein the probe driver and the guide funnel are located on the body.
2 more elements
A jet pump inspection apparatus comprising:
- a body having a calibration tube portion;
- a probe driver on the body above the calibration tube portion, the probe driver configured to provide axial movement of a probe along a length of the apparatus;
- a pole attachment connected to the probe driver and configured to connect to the at least one handling pole;
- a guide funnel on the body above the calibration tube portion and below the probe driver, the guide funnel configured to guide the probe into the jet pump inspection apparatus to a given depth;
- and
- a guide latch on the body below the calibration tube portion, the guide latch configured to secure the apparatus to a jet pump inlet.
3 more elements
Dependencies are inferred from the claim text.