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US 8,542,548 B2Granted
Semiconductor memory device and thermal code output circuit capable of correctly measuring thermal codes
AssigneeHynix Semiconductor Inc.
InventorSun Mo An
Life of this patent
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Abstract
A thermal code output circuit is provided, comprising a pulse signal generator configured to receive multiple period signals and generate a pulse signal in response to a test mode signal, a thermal code output unit configured to output multiple thermal codes in response to the pulse signal, and a strobing signal output unit configured to output the pulse signal or a reference voltage selectively as a strobing signal in response to the test mode signal.
Claims23
A thermal code output circuit, comprising:
- a pulse signal generator configured to generate an enable signal and an end signal in response to a test mode signal and multiple period signals and generate a pulse signal in response to the enable signal when the end signal is disabled;
- a thermal code output unit configured to receive multiple thermal codes from a thermal sensor, and output the multiple thermal codes in synchronization with the pulse signal;
- and
- a strobing signal output unit configured to output the pulse signal or a reference voltage selectively as a strobing signal in response to the test mode signal.
1 more element
A semiconductor memory device, comprising:
- a thermal sensor configured to generate a thermal code;
- a thermal code output unit configured to generate an enable signal and an end signal in response to a test mode signal and multiple period signals, generate a pulse signal in response to the enable signal when the end signal is disabled, receive multiple thermal codes from a thermal sensor, and output the multiple thermal codes in synchronization with the pulse signal;
- a first pad configured to output the thermal code;
- and
- a second pad configured to output the pulse signal as a strobing signal.
2 more elements
Dependencies are inferred from the claim text.