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US 8,542,537 B2Granted
Method and apparatus for temperature compensation for programming and erase distributions in a flash memory
AssigneeSpansion LLC
InventorAllan Parker
Life of this patent
Estimating the term…
Abstract
A method and apparatus for a memory device is provided. The memory device includes a memory cell, a memory controller, and a temperature-sensing device that detects a temperature. The memory controller enables adjusting, based on the detected temperature, a parameter associated with a bit-altering operation to the memory cell that changes a threshold voltage of the memory cell such that the threshold voltage to which the memory cell is changed to by the bit-altering operation is compensated for variations in temperature.
Claims20
A memory device, comprising:
- a temperature-sensing device that is arranged to detect a temperature;
- a memory cell;
- and
- a memory controller that is configured to enable adjusting, based on the detected temperature, a parameter associated with a bit-altering operation of the memory cell that changes a threshold voltage of the memory cell such that the threshold voltage to which the memory cell is changed to by the bit-altering operation is substantially compensated for variations in temperature.
1 more element
A method, comprising:
- detecting a temperature;
- and
- adjusting, based on the detected temperature, a parameter associated with a bit-altering operation of a memory cell that changes a threshold voltage of the memory cell such that the threshold voltage to which the memory cell is changed to by the bit-altering operation is substantially compensated for variations in temperature.
Dependencies are inferred from the claim text.