Inspection circuit, electro-optic device, and electronic apparatus

An electro-optic device comprising:

• a substrate;
• a data line;
• a scanning line intersecting the data line;
• a pixel portion disposed so as to correspond to the intersection of the data line and the scanning line;
• a driving circuit supplying a signal to the scanning line, the driving circuit being disposed along a first side of the substrate;
• a first terminal portion that supplies a first power supply voltage to the driving circuit;
• a second terminal portion that supplies a second power supply voltage;
• an inspection line for electrical connection with an external inspection unit;
• and
• an inspection circuit electrically connected to the inspection line, the inspection circuit being disposed along a second side that intersects the first side of the substrate, the inspection circuit including:
• a connection circuit electrically connecting the inspection line to the data line when the first power supply voltage is not supplied to the driving circuit, the connection circuit also electrically disconnecting the inspection line from the data line when the first bower supply voltage is supplied to the driving circuit;
• and
• a supply circuit supplying a control signal for controlling conduction between the data line and the inspection line to the connection circuit, the supply circuit being driven using the second power supply voltage.