Probe card
AssigneeMpi Corporation
InventorsYoung-Huang Chou, Wei-Cheng Ku, Wen-Pin Su, Jun-Liang Lai, Chao-Ping Hsieh, Ping-Hsiao Liao
Life of this patent
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Abstract
A probe card is provided. The probe card can serialize, analogize and divide a digital signal by a analog-to-digital converter (ADC), a digital-to-analog converter (DAC), and a power divided unit respectively. The probe card can increase signal channels, and is not restricted by signal channels of a tester to test more DUTs simultaneously. Moreover, the probe card has fine impedance matching and channels separating to raise testing efficiency and reduce signal loss.
Claims14
A probe card for connecting a tester and a device under test, comprising:
- a first converter connected to the tester to serialize a signal from the tester into a serial signal;
- a modulator connected to the first converter to convert the serial signal from the first converter into an analog serial signal;
- a power divided unit connected to the modulator to divide the analog serial signal into a plurality of analog serial signals and transmit the analog serial signals to signal channels respectively;
- a demodulator connected to the signal channels to convert the analog serial signals from the signal channels into a digital serial signal;
- and
- a second converter connecting the demodulator and the device under test to convert the digital serial signal from the demodulator into a digital parallel signal and transmit the digital parallel signal to the device under test.
A probe card for connecting a tester and a device under test, comprising:
- a modulator connected to the tester to convert a signal from the tester into an analog signal;
- a power divided unit connected to the modulator to divide the analog signal into a plurality of analog signals and transmit the analog signals to signal channels respectively;
- and
- a demodulator connecting the signal channels and the device under test to convert the analog signals from the signal channels into a digital signal and transmit the digital signal to the device under test.
A probe card, comprising:
- a tester terminal;
- and
- a device under test terminal, wherein the tester terminal is connected to a tester to modulate a digital signal into a modulated analog signal, and the device under test terminal is connected to a device under test to demodulate the modulated analog signal from the tester terminal into a demodulated digital signal;
- where said modulated digital signal is sent to said device under test;
- and
- where said probe card further comprises a first converter in the tester terminal to serialize the digital signal from the tester into a serial signal and a second converter in the device under test terminal to convert the demodulated digital signal into a digital parallel signal.
A probe card, comprising:
- a tester terminal;
- and
- a device under test terminal, wherein the tester terminal is connected to a tester to modulate a digital signal into a modulated analog signal, and the device under test terminal is connected to a device under test to demodulate the modulated analog signal from the tester terminal into a demodulated digital signal;
- where said modulated digital signal is sent to said device under test;
- and
- where said probe card further comprises a power divided unit connecting the tester terminal and the device under test terminal to divide and transmit the analog signal from the tester terminal to the device under test terminal.
Dependencies are inferred from the claim text.