Apparatus and method for modifying physical properties of nanostructure using focused electron beam, and nano-barcode and serial-junction nanowire fabricated thereby

An apparatus for modifying a physical property of a nanostructure using a focused electron beam, the apparatus comprising:

• the nanostructure;
• a focused electron beam- irradiating unit that serves to irradiate a nanoscale electron beam so as to be focused on the nanostructure;
• and
• a focused electron beam-controlling unit that serves to control an irradiation position of the nanoscale electron beam so as to modify a physical property of a portion of the nanostructure,
• wherein the nanostructure is a nanowire, a nanorod, or nanotube, and the focused electron beam-controlling unit serves to control the irradiation position so that a portion irradiated with the electron beam and a portion not irradiated with the electron beam are formed alternately along the nanowire, a nanorod, or nanotube;
• or wherein the nanostructure is an inorganic nanolayer, and the focused electron beam-controlling unit serves to control the irradiation position so that the inorganic nanolayer is irradiated with the electron beam to form a two-dimensional pattern.