Surface position detecting apparatus, exposure apparatus, surface position detecting method, and device manufacturing method
AssigneeNikon Corporation
InventorsYasuhiro Hidaka, Motofusa Ishikawa
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AssigneeNikon Corporation
InventorsYasuhiro Hidaka, Motofusa Ishikawa
Estimating the term…
An apparatus is provided with a light-sending optical system which makes first light from a first pattern and second light from a second pattern incident to a predetermined surface to project intermediate images of the first and second patterns onto the predetermined surface respectively; a light-receiving optical system which guides the first and second light reflected on the predetermined surface, to first and second observation surfaces to form observation images of the first and second patterns, respectively; and a detecting section which detects position information of the observation images of the first and second patterns on the first and second observation surfaces respectively and which calculates a surface position of the predetermined surface, based on the position information. The light-sending optical system projects the intermediate image of the second pattern as an inverted image in a predetermined direction relative to the intermediate image of the first pattern.
A surface position detecting apparatus comprising:
A surface position detecting apparatus comprising:
A surface position detecting apparatus comprising:
A surface position detecting method for detecting a surface position of a predetermined surface, comprising:
A surface position detecting method for detecting a surface position of a predetermined surface, comprising:
Dependencies are inferred from the claim text.