Semiconductor device and method for fabricating the same
AssigneePanasonic Corporation
InventorsYuichiro Sasaki, Katsumi Okashita, Bunji Mizuno
Life of this patent
Estimating the term…
Loading patent…
AssigneePanasonic Corporation
InventorsYuichiro Sasaki, Katsumi Okashita, Bunji Mizuno
Estimating the term…
A method for fabricating a semiconductor device includes: forming a fin-type semiconductor region on a substrate; and introducing an n-type impurity into at least a side of the fin-type semiconductor region by a plasma doping process, thereby forming an n-type impurity region in the side of the fin-type semiconductor region. In the introducing the n-type impurity, when a source power in the plasma doping process is denoted by a character Y [W], the supply of a gas containing the n-type impurity per unit time and per unit volume is set greater than or equal to 5.1×10−8/((1.72.51/24.51)×(Y/500)) [mol/(min·L·sec)], and the supply of a diluent gas per unit time and per unit volume is set greater than or equal to 1.7×10−4/((202.51/24.51)×(Y/500)) [mol/(min·L·sec)].
A method for fabricating a semiconductor device, the method comprising:
Dependencies are inferred from the claim text.