Determining calibration parameters for a lithographic process
AssigneeSynopsys, Inc.
InventorsXin Zhou, Yaogang Lian, Robert E. Gleason
Life of this patent
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AssigneeSynopsys, Inc.
InventorsXin Zhou, Yaogang Lian, Robert E. Gleason
Estimating the term…
A technique for determining a set of calibration parameters for use in a model of a photo-lithographic process is described. In this calibration technique, images of a test pattern that was produced using the photo-lithographic process are used to determine corresponding sets of calibration parameters. These images are associated with at least three different focal planes in an optical system, such as a photo-lithographic system that implements the photo-lithographic process. Moreover, an interpolation function is determined using the sets of calibration parameters. This interpolation function can be used to determine calibration parameters at an arbitrary focal plane in the photo-lithographic system for use in simulations of the photo-lithographic process, where the set of calibration parameters are used in a set of transmission cross coefficients in the model of the photo-lithographic process.
A computer-implemented method for determining a set of calibration parameters for use in a model of a photo-lithographic process, comprising:
A computer-program product for use in conjunction with a computer system, the computer-program product comprising a non-transitory computer-readable storage medium and a computer-program mechanism embedded therein for determining a set of calibration parameters for use in a model of a photo-lithographic process, the computer-program mechanism including:
A computer system, comprising:
Dependencies are inferred from the claim text.