Determining component failure rates using accelerated life data
AssigneeInternational Business Machines Corporation
InventorsAmanda E. Mikhail, Mark D. Plucinski
Life of this patent
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AssigneeInternational Business Machines Corporation
InventorsAmanda E. Mikhail, Mark D. Plucinski
Estimating the term…
A method of statistical analysis is based on an accelerated degradation model for estimating the failure rate from a set of accelerated life data (e.g. stress, humidity, temperature, voltage, resistance, vibration, etc.). The method re-samples randomly distributed data and organizes it into subsets that may be ordered. The maximum is found for each subset. From the maximums a parametric LEV distribution is determined. Maximum Likelihood Estimation methods may be used to find the parameters employed in the determined LEV distribution. The failure rate is calculated using the determined LEV distribution of the sample maximums.
A method for selecting a particular component from a plurality of possible components, wherein the particular component is utilized in an electronic system, the method comprising:
A computer implemented method for determining failure rate of a component from accelerated life data, wherein a computer is configured for implementing the computer implemented method comprising:
A computer program product comprising a non-transitory computer usable medium having computer program logic recorded thereon for enabling a processor to determine the failure rate of a component, wherein the computer program logic when executed by the processor causes a computer to:
Dependencies are inferred from the claim text.