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US 8,274,135 B2Granted
Fuse of semiconductor device
AssigneeHynix Semiconductor Inc.
InventorSang Heon Kim
Life of this patent
Estimating the term…
Abstract
The present invention relates to a fuse for a semiconductor device, and discloses the technique capable of preventing fuse damage, which might occur during a fuse blowing step, with reducing area of the fuse occupying the semiconductor device. The present invention includes a common source region, wherein a plurality of fuses are radially arranged about the common source region, and a fuse box wall is formed outside the fuses.
Claims15
A semiconductor device having a fuse box, the fuse box comprising:
- a common source region;
- a plurality of fuses extending radially from the common source region, the plurality of fuses comprising at least a first fuse, a second fuse, and a third fuse, each fuse having a first end coupled to the common source region and a second end located at an opposing side of the first end;
- and
- a fuse box wall provided proximate to the second ends of the plurality of fuses.
1 more element
Dependencies are inferred from the claim text.