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AssigneeThe Board of Trustees of the Leland Stanford Junior University
InventorsAydogan Ozcan, Michael J. F. Digonnet, Gordon S. Kino
Estimating the term…
A method determines a transient response of a sample. The method includes providing a measured magnitude of the Fourier transform of a complex electric field temporal profile of a pulse sequence comprising a first pulse indicative of the transient response of the sample and a second pulse. The method further includes providing an estimated phase term of the Fourier transform of the complex electric field temporal profile of the pulse sequence. The method further includes multiplying the measured magnitude and the estimated phase term to generate an estimated Fourier transform of the complex electric field temporal profile of the pulse sequence. The method further includes calculating an inverse Fourier transform of the estimated Fourier transform, wherein the inverse Fourier transform is a function of time. The method further includes calculating an estimated complex electric field temporal profile of the pulse sequence by applying at least one constraint to the inverse Fourier transform.
A method of determining a transient response of a sample using a femtosecond spectroscopy analysis system, the method comprising:
A non-transitory tangible computer-readable medium having instructions stored thereon which cause a general-purpose computer of a femtosecond spectroscopy analysis system to perform a method of determining a transient response of a sample, the method comprising:
A computer system for determining a transient response of a sample, the computer system comprising:
Dependencies are inferred from the claim text.