Semiconductor device, method for mounting semiconductor device, and mounting structure of semiconductor device
AssigneeSharp Kabushiki Kaisha
InventorYuya Ohnishi
Life of this patent
Estimating the term…
Abstract
A semiconductor device includes a semiconductor substrate on which an electrode and a Cu bump are stacked. On the electrode and the Cu bump, a metal bump layer is provided. The metal bump layer comprises (i) a solder layer via which the semiconductor device is bonded and electrically connected to the mounting substrate by metal bonding and (ii) a Cu layer. A intermetallic compound can be formed by interdiffusion of the Cu layer and the solder layer.
Claims7
A semiconductor device to be bonded and electrically connected to a mounting substrate by metal bonding, the semiconductor device comprising:
- a semiconductor substrate on which an electrode is provided,
- a metal bump being stacked on the electrode, the metal bump including (i) solder via which the semiconductor device is bonded and electrically connected to the mounting substrate and (ii) metal material, the metal material being any one of Cu, Au, and Ni, an intermetallic compound being formed by interdiffusion of the metal material and the solder,
- wherein the metal bump comprises at least one metal bump layer, each metal bump layer comprising a layer comprised of the metal material stacked on a layer comprised of the solder;
- and
- wherein the layer comprised of the solder has a thickness in a range of not less than 3 μm to not more than 12 μm.
A semiconductor device to be bonded and electrically connected to a mounting substrate by metal bonding, the semiconductor device comprising:
- a semiconductor substrate on which an electrode is provided,
- a metal bump being stacked on the electrode, the metal bump including (i) solder via which the semiconductor device is bonded and electrically connected to the mounting substrate and (ii) metal material, the metal material being any one of Cu, Au, and Ni, an intermetallic compound being formed by interdiffusion of the metal material and the solder,
- wherein the metal bump comprises at least one metal bump layer, each metal bump layer comprising a layer comprised of the metal material stacked on a layer comprised of the solder;
- and
- wherein at least two but not more than five metal bump layers are stacked on, the electrode.
A semiconductor device to be bonded and electrically connected to a mounting substrate by metal bonding, the semiconductor device comprising:
- a semiconductor substrate on which an electrode is provided,
- a metal bump being stacked on the electrode, the metal bump including (i) solder via which the semiconductor device is bonded and electrically connected to the mounting substrate and (ii) metal material, the metal material being any one of Cu, Au, and Ni, an intermetallic compound being formed by interdiffusion of the metal material and the solder,
- wherein the metal bump comprises at least one metal bump layer, each metal bump layer comprising a layer comprised of the metal material stacked on a layer comprised of the solder;
- and
- wherein a layer comprised of the solder is further stacked on the metal bump layer.
A semiconductor device to be bonded and electrically connected to a mounting substrate by metal bonding, the semiconductor device comprising:
- a semiconductor substrate on which an electrode is provided,
- a metal bump being stacked on the electrode, the metal bump including (i) solder via which the semiconductor device is bonded and electrically connected to the mounting substrate and (ii) metal material, the metal material being any one of Cu, Au, and Ni, an intermetallic compound being formed by interdiffusion of the metal material and the solder,
- wherein the metal bump comprises at least one metal bump layer, each metal bump layer comprising a layer comprised of the metal material stacked on a layer comprised of the solder;
- and
- wherein at least one of layers comprised of the solder has a thickness in a range of not less than 3 μm to not more than 12 μm.
Dependencies are inferred from the claim text.