Pressure-sensitive adhesive sheet for testing
AssigneeNitto Denko Corporation
InventorsYoshio Terada, Fumiteru Asai, Hirokuni Hashimoto
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AssigneeNitto Denko Corporation
InventorsYoshio Terada, Fumiteru Asai, Hirokuni Hashimoto
Estimating the term…
Disclosed is an adhesive sheet for inspection, which is obtained by arranging an adhesive layer on a base film. The base film and the adhesive layer are electrically conductive, and an electrically conductive path is formed between the base film and the adhesive layer. Consequently, an inspection for electrical conduction of a semiconductor wafer or a semiconductor chip obtained by dicing a semiconductor wafer can be performed while the semiconductor wafer or the semiconductor chip is bonded to the adhesive sheet. In addition, this adhesive sheet for inspection enables to prevent deformation (warping) or breakage of a semiconductor wafer or generation of cracks or scratches on the back surface of the semiconductor wafer during the inspection.
A pressure-sensitive adhesive sheet for testing comprising a base film and only a single pressure-sensitive adhesive layer provided on the base film, wherein
The pressure-sensitive adhesive sheet for testing comprising a base film and a pressure-sensitive adhesive layer provided on the base film, wherein the base film and the pressure-sensitive adhesive layer have conductivity, and an electrically conductive path is provided therebetween, and wherein the pressure-sensitive adhesive layer has a laminated structure in which a first conductive pressure-sensitive adhesive layer and a second conductive pressure-sensitive adhesive layer are laminated one by one from the base film side,
A method of manufacturing a semiconductor device comprising:
Dependencies are inferred from the claim text.