Fringe capacitor using bootstrapped non-metal layer
AssigneeStandard Microsystems Corporation
InventorScott C. McLeod
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AssigneeStandard Microsystems Corporation
InventorScott C. McLeod
Estimating the term…
Capacitors configured in a switched-capacitor circuit on a semiconductor device may comprise very accurately matched, high capacitance density metal-to-metal capacitors, using top-plate-to-bottom-plate fringe-capacitance for obtaining the desired capacitance values. A polysilicon plate may be inserted below the bottom metal layer as a shield, and bootstrapped to the top plate of each capacitor in order to minimize and/or eliminate the parasitic top-plate-to-substrate capacitance. This may free up the bottom metal layer to be used in forming additional fringe-capacitance, thereby increasing capacitance density. By forming each capacitance solely based on fringe-capacitance from the top plate to the bottom plate, no parallel-plate-capacitance is used, which may reduce capacitor mismatch. Parasitic bottom plate capacitance to the substrate may also be eliminated, with only a small capacitance to the bootstrapped polysilicon plate remaining. The capacitors may be bootstrapped by coupling the top plate of each capacitor to a respective one of the differential inputs of an amplifier comprised in the switched-capacitor circuit.
A capacitor on a semiconductor having accurate, high density capacitance between a first node corresponding to a top plate of the capacitor and a second node corresponding to a bottom plate of the capacitor, the capacitor comprising:
A semiconductor device comprising a capacitor, the semiconductor device comprising:
Dependencies are inferred from the claim text.