Exposure apparatus and device manufacturing method
AssigneeCanon Kabushiki Kaisha
InventorYoshiyuki Sekine
Life of this patent
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Abstract
An exposure apparatus which exposes a substrate with exposure light, includes a projection optical system which projects a pattern image of an original onto the substrate; a first illumination unit which illuminates the original with the exposure light; and a second illumination unit which guides illumination light that is different from the exposure light for exposing the substrate to the projection optical system, the second illumination unit includes a modifier which modifies an illumination distribution of the illumination light entering an optical element near a pupil of the projection optical system and an optical element which is the closest to the original in the projection optical system.
Claims20
An exposure apparatus which exposes a substrate with exposure light, comprising:
- a projection optical system which projects a pattern image of an original onto the substrate;
- a first illumination unit which illuminates the original with the exposure light using a modified illumination;
- and
- a plurality second illumination unit which guides illumination light that is different from the exposure light for exposing the substrate to said projection optical system,
- wherein said second illumination unit includes a modifier which changes an illumination distribution of the illumination light transmitting through an optical element near a pupil of said projection optical system and an optical element which is the closest to the original in said projection optical system,
- wherein the modifier forms a rotationally symmetric illumination distribution based on the illumination distribution formed by said first illumination unit, as a sum of an illumination distribution formed by the plurality of second illumination units and an illumination distribution formed by said first illumination unit, on said optical element near the pupil of said projection optical system and on said optical element which is the closest to the original in said projection optical system.
An exposure apparatus which exposes a substrate with exposure light, comprising:
- a projection optical system which projects a pattern of an original onto the substrate;
- a first illumination unit which illuminates the original with the exposure light using a modified illumination;
- a second illumination unit which guides illumination light from a light source different from that of the exposure light to said projection optical system;
- and
- an optical path modification unit which modifies a traveling direction of the illumination light, emerging from said second illumination unit and entering said projection optical system, from toward the substrate to toward the original,
- wherein said second illumination unit includes a modifier which changes an illumination distribution of the illumination light transmitting through an optical element near a pupil of said projection optical system and an optical element which is the closest to the original in said projection optical system, and
- wherein an illumination distribution as a sum of an illumination distribution formed by light traveling forward toward the substrate and an illumination distribution formed by light guided by said optical path modification unit to travel back forms a rotationally symmetric illumination distribution, as a sum with an illumination distribution of the light from said first illumination unit, on an optical element of said projection optical system.
Dependencies are inferred from the claim text.