Method of manufacturing semiconductor device
AssigneeHitachi Kokusai Electric Inc.
InventorsKiyohisa Ishibashi, Yasuhiro Inokuchi, Atsushi Moriya, Yoshiaki Hashiba
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AssigneeHitachi Kokusai Electric Inc.
InventorsKiyohisa Ishibashi, Yasuhiro Inokuchi, Atsushi Moriya, Yoshiaki Hashiba
Estimating the term…
In a dry cleaning process, breakage of a gas supply pipe can be prevented, and maintenance efficiency can be increased. There is provided a method of manufacturing a semiconductor device, comprising: (a) loading a substrate into a process chamber; (b) forming a silicon film or a silicon compound film on the substrate loaded in the process chamber by supplying a raw-material gas to a gas supply pipe disposed in the process chamber to introduce the raw-material gas into the process chamber; (c) unloading the substrate from the process chamber; (d) heating an inside of the process chamber after unloading the substrate to generate a crack in a thin film formed inside the process chamber; (e) decreasing an inside temperature of the process chamber after carrying out the step (d) with the substrate unloaded from the process chamber; and (f) introducing a cleaning gas into the process chamber by supplying the cleaning gas to the gas supply pipe after the step (e) with the substrate unloaded from the process chamber.
A method of manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.