Silicon carbide single crystal, silicon carbide substrate and manufacturing method for silicon carbide single crystal
AssigneeSumitomo Electric Industries, Ltd.
InventorsHiromu Shiomi, Hiroyuki Kinoshita
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AssigneeSumitomo Electric Industries, Ltd.
InventorsHiromu Shiomi, Hiroyuki Kinoshita
Estimating the term…
SiC single crystal that includes a first dopant functioning as an acceptor, and a second dopant functioning as a donor is provided, where the content of the first dopant is no less than 5×1015 atoms/cm3, the content of the second dopant is no less than 5×1015 atoms/cm3, and the content of the first dopant is greater than the content of the second dopant. A manufacturing method for silicon carbide single crystal is provided with the steps of: fabricating a raw material by mixing a metal boride with a material that includes carbon and silicon; vaporizing the raw material; generating a mixed gas that includes carbon, silicon, boron and nitride; and growing silicon carbide single crystal that includes boron and nitrogen on a surface of a seed crystal substrate by re-crystallizing the mixed gas on the surface of the seed crystal substrate.
A silicon carbide single crystal which comprises a first dopant consisting of boron functioning as an acceptor, and a second dopant consisting of nitrogen functioning as a donor, wherein the silicon carbide single crystal contains only boron and nitrogen as dopants, the content of said first dopant and said second dopant is not less than 1×1016 atoms/cm3, the content of said first dopant is greater than the content of said second dopant, the content of said first dopant is not less than 1×1016 atoms/cm3 and no greater than 1×1017 atoms/cm3, and the difference in content between said first dopant and said second dopant is not greater than 5×1016 atoms/cm3.
A manufacturing method for silicon carbide single crystal, comprising the steps of:
Dependencies are inferred from the claim text.