Semiconductor device
AssigneeKabushiki Kaisha Toshiba
InventorsTatsuya Ohguro, Takashi Izumida, Satoshi Inaba, Kimitoshi Okano, Nobutoshi Aoki
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AssigneeKabushiki Kaisha Toshiba
InventorsTatsuya Ohguro, Takashi Izumida, Satoshi Inaba, Kimitoshi Okano, Nobutoshi Aoki
Estimating the term…
A semiconductor device has a plurality of fins formed on a semiconductor substrate to be separated from each other, a first contact region which connects commonly one end side of the plurality of fins, a second contact region which connects commonly the other end side of the plurality of fins, a gate electrode arranged to be opposed to at least both side surfaces of the plurality of fins by sandwiching a gate insulating film therebetween, a source electrode including the first contact region and the plurality of fins on a side closer to the first contact region than the gate electrode, and a drain electrode including the second contact region and the plurality of fins on a side closer to the second contact than the gate electrode. The ratio Rd/Rs of a resistance Rd of each fin in the drain region to a resistance Rs of each fin in the source region is larger than 1.
A semiconductor device comprising:
A method of fabricating a semiconductor device comprising:
Dependencies are inferred from the claim text.