Back to results
US 7,888,225 B2Granted
Method of manufacturing an electronic device including a PNP bipolar transistor
AssigneeTexas Instruments Deutschland GmbH
InventorAlfred Haeusler
Life of this patent
Estimating the term…
Abstract
A method of manufacturing an electronic device including a PNP bipolar transistor comprises forming a collector in a substrate, depositing a base layer and an emitter layer on the substrate, and growing a nitride interface layer on the base layer as a base current modulation means, such that the nitride interface layer is arranged between the base layer and the emitter layer.
Claims7
A method of manufacturing an electronic device including a PNP bipolar transistor, the method comprising:
- forming a collector in a substrate;
- depositing a base layer and an emitter layer on the substrate;
- and
- growing a nitride interface layer on the base layer as a base current modulator, with the nitride interface layer arranged between the base layer and the emitter layer;
- wherein the step of growing the nitride interface layer is carried out in a mixture of NH3, N2, H2 and O2.
2 more elements
A method of manufacturing an electronic device including a PNP bipolar transistor, the method comprising:
- forming a P-well in a substrate to define a collector of the PNP bipolar transistor;
- forming a base layer epitaxially on the substrate above a portion of the P-well, a central region of the base layer being formed of an N-type crystalline material and a peripheral region being formed of a polycrystalline material;
- forming a nitride interface layer over a part of the central region of the base layer;
- forming an oxide layer adjacent to and surrounding the nitride interface layer over a remainder of the central region of the base layer not covered by the nitride interface layer;
- forming a nitride layer over the entirety of the oxide layer;
- forming a P-type layer over the nitride interface layer and the nitride layer to define an emitter of the PNP bipolar transistor;
- and
- forming sidewall spacers on edges of a stack comprising the oxide layer, the nitride layer and the P-type layer, the sidewall spacers extending from an uppermost surface of the P-type layer to a top surface in the peripheral region, leaving a portion of the top surface in the peripheral region exposed;
- whereby the P-type layer defining the emitter is spaced by the nitride interface layer from the base layer in a central portion and is spaced by the stack from the base layer in a peripheral portion.
6 more elements
Dependencies are inferred from the claim text.