Nonvolatile semiconductor memory device and method for manufacturing the same
AssigneeKabushiki Kaisha Toshiba
InventorsTakahisa Kanemura, Takashi Izumida, Nobutoshi Aoki
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AssigneeKabushiki Kaisha Toshiba
InventorsTakahisa Kanemura, Takashi Izumida, Nobutoshi Aoki
Estimating the term…
According to an aspect of the present invention, there is provided a nonvolatile semiconductor memory device including: a semiconductor substrate; memory cell transistors that are series-connected; and a select transistor that includes: a first diffusion region that is formed in the semiconductor substrate at one end of the memory cell transistors; a first insulating film that is formed on the semiconductor substrate at a side of the first diffusion region; a select gate electrode that is formed on the first insulating film; a semiconductor pillar that is formed to extend upward from the semiconductor substrate and to be separated from the select gate electrode; a second insulating film that is formed between the select gate electrode and the semiconductor pillar; and a second diffusion region that is formed on the semiconductor pillar.
A nonvolatile semiconductor memory device comprising:
Dependencies are inferred from the claim text.