High temperature range electrical circuit testing

An electrical circuit testing assembly comprising:

• a testing circuitry support structure having testing circuitry;
• a probe support structure that includes at least one electrical probe;
• a mechanical intermediating structure that is structured to permit the testing circuitry support structure to move relative to the probe support structure;
• and
• a flexible electrical intermediating structure that permits electrical communication between the probe support structure and the testing circuitry support structure even though the probe support structure is free to move relative to the testing circuitry support structure, at least within a certain range, wherein the mechanical intermediating structure permits the testing circuit support structure to move relative to the probe support structure while supporting the testing circuitry support structure, and while maintaining electrical connection between the probe support structure and the testing circuitry support structure.