Lithographic apparatus, method of calibrating a lithographic apparatus and device manufacturing method

A lithographic apparatus, comprising:

• a projection system configured to project a pattern from a patterning device onto a substrate;
• a substrate table configured to support the substrate and including at least one reflective element formed in a lateral side thereof;
• a substrate table displacement device configured to move the substrate table relative to the projection system;
• a substrate table temperature monitor configured to determine a temperature of at least a portion of the substrate table;
• a disturbance detector configured to estimate a thermally-induced shift in position with respect to a nominal position of the at least one reflective element using the temperature determined by the substrate table temperature monitor;
• a substrate table position detector configured to determine a disturbance compensated position of said substrate table by reflecting radiation from the at least one reflective element to obtain an actual position measurement and adjusting the actual position measurement for the thermally-induced shift in position of the at least one reflective element caused by the temperature and estimated by the disturbance detector;
• and
• a control system configured to supply a control signal to the substrate table displacement device so as to move said substrate table along a pre-determined path, said control signal being determined based on the disturbance compensated position of the substrate table determined by the substrate table position detector.