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OwnerLeo A. Fama, James F. Mancusoinventors
Estimating the term…
A method and apparatus allowing for simultaneous direct viewing and electronic capture of images in an electron microscope (TEM). For this, the usual opaque direct viewing plate in the TEM is replaced in form and in function by a two-sided direct viewing plate including at least one scintillator. This plate produces light emissions from both its upper and lower surfaces, which allows an electronic camera below the plate to be used simultaneously with direct human viewing from above the plate. The method and apparatus are also compatible with traditional permanent image recording units that are often desired in such microscopes.
A method for imaging a specimen in an electron microscope comprising the steps of passing a beam of electrons along an axis through said specimen to produce a transmitted beam containing in an electron pattern information about the specimen and projecting said beam onto a scintillator of a two-sided direct viewing plate positioned on said axis thereby creating a corresponding pattern of emitted light that may be observed obliquely from above the plate by a human observer and/or from directly below the same plate by an electronic camera positioned on said axis, said transparent plate being removable so that the transmitted beam may expose a permanent image recording medium positioned on said axis by a support.
A method of converting a conventional electron microscope of the type including a housing defining a vertical column and an observation chamber at the foot of the column, said housing having a vertical axis, a support in the column for supporting a specimen on said axis, a one-sided opaque direct viewing plate positioned on said axis in said observation chamber, said opaque direct viewing plate extending perpendicular to said axis and having an upper surface, a viewing window in a wall of the observation chamber through which an observer may view the direct viewing plate obliquely from above, an electron beam generator in said column for transmitting an electron beam along said axis through a specimen on said specimen support, and means in said column for projecting the transmitted electron beam along said axis onto the direct viewing plate to form a visible image on the upper surface thereof corresponding to the specimen supported by the specimen support to an electron microscope in which the visible image formed on the opaque direct viewing plate can be viewed from above by an observer looking through said window and simultaneously recorded electronically from below comprising the steps of
An electron microscope of the type including a housing defining a vertical column and an observation chamber at the foot of the column, said housing having a vertical axis, a support in the column for supporting a specimen on said axis, a direct viewing plate positioned on said axis in said observation chamber, said direct viewing plate extending perpendicular to said axis and having an upper surface, a viewing window in a wall of the observation chamber through which an observer may view the direct viewing plate obliquely from above, an electronic recording device positioned on said axis below the direct viewing plate, an electron beam generator in said column for transmitting an electron beam along said axis through said specimen, and electromagnets in said column for projecting the transmitted electron beam along said axis onto the direct viewing plate to form a visible image on the upper surface thereof corresponding to the structure of said specimen, the improvement wherein
Dependencies are inferred from the claim text.