Yttrium oxide material, member for use in semiconductor manufacturing apparatus, and method for producing yttrium oxide material

Abstract

A substrate of an electrostatic chuck, which is a member for use in a semiconductor manufacturing apparatus, is formed of an yttrium oxide material that contains yttrium oxide (Y2O3), silicon carbide (SiC), and a compound that contains a rare-earth element (RE), Si, O, and N. The yttrium oxide material contains RE8Si4N4O14 as a compound that contains a rare-earth element (RE), Si, O, and N, wherein RE may be La or Y. Y8Si4N4O14 is produced during a sintering step of a raw material that contains the main component Y2O3 and an accessory component Si3N4. Y8Si4N4O14 and SiC in the yttrium oxide material improve mechanical strength and volume resistivity.

Dependencies are inferred from the claim text.