Method, device, and test specimen for testing a part, and use of the method and device

A method for at least one of (a) ascertaining and (b) testing a resolution of an ultrasonic testing system, comprising:

• at least one of (a) testing detectability of at least one flaw in a component and (b) evaluating ultrasonic signals of the flaw, including:
• generating an electronic specification of the flaw, the electronic specification including at least one of (a) a two-dimensional and (b) a three-dimensional point pattern;
• after the generating, manufacturing a test specimen, for each point of the point pattern, a microcrack in the test specimen generated at a corresponding position to form a microcrack field representing the flaw;
• and
• recording by the testing system and evaluating ultrasonic signals of the test specimen.

A device for at least one of (a) testing detectability of at least one flaw in a component and (b) evaluating an ultrasonic signal of the flaw, comprising:

• a device adapted to generate an electronic specification of the flaw, the specification including at least one of (a) a two-dimensional and (b) a three-dimensional point pattern;
• a device adapted to produce a test specimen after generation of the electronic specification of the flaw, for each point of the point pattern, a microcrack produced at a position of the point to form a microcrack field representing the flaw;
• and
• a device adapted to record and evaluate ultrasonic signals of the test specimen.

A method, comprising:

• at least one of (a) ascertaining and (b) testing a resolution of an ultrasonic testing system by a device adapted to at least one of (a) test a detectability of at least one flaw in a component and (b) evaluate an ultrasonic signal of the flaw, the device including:
• a device adapted to generate an electronic specification of the flaw, the specification including at least one of (a) a two-dimensional and (b) a three-dimensional point pattern;
• a device adapted to produce a test specimen after generation of the electronic specification of the flaw, for each point of the point pattern, a microcrack produced at a position of the point to form a microcrack field representing the flaw;
• and
• a device adapted to record and evaluate ultrasonic signals of the test specimen, the testing system arranged as a part of the device adapted to record and evaluate the ultrasonic signals.