Method and system of recognizing ID marks appended on base materials, and method of manufacturing products by base materials with the ID marks

A method of recognizing ID marks, comprising:

• storing each of original bit data of ID marks appended on all of a plurality of base materials assigned as one lot in a management data base of a host computer;
• reading each of the ID marks appended the base materials, and converting the ID marks into bit data, respectively;
• identifying each of the converted bit data with one of the original bit data, when deterioration of the ID mark is within an error correction ability;
• specifying the converted bit data of each of the ID marks as damaged data, when the deterioration of the ID mark is beyond the error correction ability;
• sampling candidate original data among the original bit data stored in the management data base each of the candidate original data being original bit data that is not identified by the converted bit data;
• comparing bit by bit each of the damaged data with the candidate original data, and calculating concordance ratios between the damaged data and the candidate original data;
• conjecturing one of candidate original data as a conjectured bit data for each of the damaged data under a paramount-criterion, which conjectures candidate original data having the highest concordance ratio to subject damaged data as the conjectured bit data of the subject damaged data;
• and
• judging whether the conjectured bit data can be adopted as true bit data for each of the damaged data under a subsidiary-criterion, which is different from the paramount-criterion.

A system for recognizing ID marks appended respectively on a plurality of base materials so as to identify each of the base materials, the system comprising:

• a reading unit configured to read all of the ID marks appended on all of the base materials, and to convert all of the ID marks into bit data, respectively;
• an error correction unit configured to correct the converted bit data into normal bit data when deterioration of the ID mark is within an error correction ability, and to specify the converted bit data as damaged data, when the deterioration of the ID mark is beyond the error correction ability;
• a host computer having a sampling unit configured to sample candidate original data among original bit data of the ID marks, by identifying the converted bit data with one of the original bit data, each of the candidate original data being original bit data that is not identified by the converted bit data, so as to sort all of the base materials into normal and damaged groups, the normal group consisting of base materials to which normal ID marks are appended, identifying each of the converted bit data of the normal ID mark with one of original bit data, as deterioration of the normal ID mark is within an error correction ability, the damaged group consisting of base materials to which damaged ID marks are appended, specifying the converted bit data of each of the damaged ID marks as damaged data, as the deterioration of the damaged ID mark is beyond the error correction ability;
• a comparator configured to compare bit by bit candidate original data with each of the damaged data of the damaged ID marks of the damaged group, to calculate, mark by mark, concordance ratios between the candidate original data and the damaged data, and to conjecture an ID mark having one of candidate original data having the highest concordance ratio to subject damaged data as a damaged ID mark having the conjectured bit data of the subject damaged data so as to identify each of the base materials of the damaged group;
• and
• a judgement unit configured to judge whether the conjectured bit data can be adopted as true bit data of the damaged group for each of the subject damaged data.

A system for recognizing ID marks, the system comprising:

• a reading unit configured to read each of the ID marks appended on a plurality base materials, and to convert the ID marks into bit data, respectively;
• an error correction unit configured to correct the converted bit data into normal bit data when deterioration of the ID mark is within an error correction ability, and to specify the converted bit data as damaged data, when the deterioration of the ID mark is beyond the error correction ability;
• a host computer having a sampling unit configured to sample candidate original data among original bit data of the ID marks, by identifying the converted bit data with one of the original bit data, each of the candidate original data being original bit data that is not identified by the converted bit data;
• a comparator configured to compare bit by bit candidate original data with each of the damaged data, to calculate concordance ratios between the candidate original data and the damaged data and to conjecture one of candidate original data having the highest concordance ratio to subject damaged data as the conjectured bit data of the subject damaged data;
• and
• a judgement unit configured to judge whether the conjectured bit data can be adopted as true bit data for each of the subject damaged data,
• wherein the judgement unit adopts the conjectured bit data as the true bit data, when the concordance ratio is equal to or larger than 63%.

A system for recognizing ID marks, the system comprising:

• a reading unit configured to read each of the ID marks appended on a plurality base materials, and to convert the ID marks into bit data, respectively;
• an error correction unit configured to correct the converted bit data into normal bit data when deterioration of the ID mark is within an error correction ability, and to specify the converted bit data as damaged data, when the deterioration of the ID mark is beyond the error correction ability;
• a host computer having a sampling unit configured to sample candidate original data among original bit data of the ID marks, by identifying the converted bit data with one of the original bit data, each of the candidate original data being original bit data that is not identified by the converted bit data;
• a comparator configured to compare bit by bit candidate original data with each of the damaged data, to calculate concordance ratios between the candidate original data and the damaged data and to conjecture one of candidate original data having the highest concordance ratio to subject damaged data as the conjectured bit data of the subject damaged data;
• and
• a judgement unit configured to judge whether the conjectured bit data can be adopted as true bit data for each of the subject damaged data,
• wherein the judgement unit adopts the conjectured bit data as the true bit data, when a difference between the highest concordance ratio and second highest concordance ratio is equal to or larger than 8%.

A system of for recognizing ID marks, the system comprising:

• a reading unit configured to read each of the ID marks appended on a plurality base materials, and to convert the ID marks into bit data, respectively;
• an error correction unit configured to correct the converted bit data into normal bit data when deterioration of the ID mark is within an error correction ability, and to specify the converted bit data as damaged data, when the deterioration of the ID mark is beyond the error correction ability;
• a host computer having a sampling unit configured to sample candidate original data among original bit data of the ID marks, by identifying the converted bit data with one of the original bit data, each of the candidate original data being original bit data that is not identified by the converted bit data;
• a comparator configured to compare bit by bit candidate original data with each of the damaged data, to calculate concordance ratios between the candidate original data and the damaged data and to conjecture one of candidate original data having the highest concordance ratio to subject damaged data as the conjectured bit data of the subject damaged data;
• and
• a judgement unit configured to judge whether the conjectured bit data can be adopted as true bit data for each of the subject damaged data,
• wherein the judgement unit adopts the conjectured bit data as the true bit data, when the number of base materials which have generated the damaged data is equal to or smaller than five.

A method of manufacturing products, the method comprising:

• appending respectively first ID marks on respective unprocessed sites on a plurality of base materials so as to identify each of the base materials;
• storing each of original bit data of the first ID marks appended on all of the base materials in a management data base of a host computer;
• executing a subject process on all of the base materials;
• reading all of the first ID marks appended on all of the base materials after the subject process, converting the first ID marks into bit data, respectively, sorting all of the base materials into normal and damaged groups, the normal group consisting of base materials to which normal ID marks are appended, identifying the converted bit data of each of the first ID marks of the normal ID mark with one of original bit data, as deterioration of the first normal ID mark is within an error correction ability, the damaged group consisting of base materials to which damaged ID marks are appended, specifying the converted bit data of each of the first ID marks of the damaged ID marks as damaged data, as the deterioration of the damaged ID mark is beyond the error correction ability, identifying each of the base materials of the damaged group, by comparing bit by bit candidate original data with each of the damaged data of the damaged ID marks of the damaged group and calculating, mark by mark, concordance ratios between the candidate original data and the damaged data, each of the candidate original data being original bit data that is not identified by the converted bit data, and conjecturing an ID mark having one of candidate original data as a damaged ID mark having conjectured bit data for each of the damaged data under a paramount-criterion, which conjectures candidate original data having the highest concordance ratio to subject damaged data as the conjectured bit data of the subject damaged data;
• and
• generating a second ID mark based upon the conjectured bit data and appending the second ID mark adjacent to the first ID mark on the damaged base material;
• and
• executing a next process of the subject process on all of the base materials.