Internal power voltage generating circuit in semiconductor memory device

Abstract

A method and circuit are disclosed for generating an internal power voltage in a semiconductor memory device. The method includes receiving an external power voltage in an internal power voltage generating circuit and activating a power-up signal during a first period in the applied external power voltage rising to a desired level, powering-up the internal power voltage in relation to the external power voltage during the first period, and continuing the power-up of the internal power voltage during a second period following the first period, the second period extending beyond the deactivation of the power-up signal until receipt of an active command signal.

Dependencies are inferred from the claim text.