Method and apparatus for measuring heterodyne optical interference utilizing adjustable polarizing plate
AssigneeHitachi High-Technologies Corporation
InventorShigeru Serikawa
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AssigneeHitachi High-Technologies Corporation
InventorShigeru Serikawa
Estimating the term…
A method and an apparatus for measuring optical heterodyne interference in which a reference light and a measurement light differing in frequency is generated. The measurement light is S- or P-polarization light which is irradiated on a target through a polarization light beam splitter, and the reference light is P or S-polarization light which is reflected by a mirror. Interference of the measurement light from the target and the reference light reflected from the mirror is obtained by a light receiving element so as to measure a surface condition or detecting a surface detect on the target. A polarizing plate which is arranged before the light receiving element has an axis rotated so that a signal from the light receiving element becomes a minimum when the reference light is selectively shut off by a light shut off mechanism arranged before the polarization light beam splitter.
A method for measuring an optical heterodyne interference, comprising the following steps of:
An apparatus for measuring an optical heterodyne interference, comprising:
Dependencies are inferred from the claim text.