Electronic device test apparatus for successively testing electronic devices

An electronic device test apparatus comprising:

• a test tray for carrying and transporting a plurality of electronic devices;
• a plurality of test units each including a test head and transporting said test tray inside the test unit and bringing said electronic devices into electrical contact with sockets on the test head side for an electrical test;
• said plurality of test units transporting said electronic devices between the using said test tray as a medium;
• a loading transport unit for receiving another conveyance medium different from said test tray or a test tray of the same structure and transporting and loading electronic devices to said test tray;
• said loading transport unit connected to a frontmost stage test unit and supplying a test tray to said frontmost stage test unit;
• an unloading transport unit receiving electronic devices from said test tray and transporting and unloading electronic devices to said other conveyance medium or a test tray of the same structure;
• and
• a second intermediate conveyance unit for taking out to the outside of the process the electronic devices carried on said test tray, wherein
• said second intermediate conveyance unit provided connected between a previous process test unit and a later process test unit, and
• said second intermediate conveyance unit receiving a first test tray unloaded from the previous process test unit, transporting at least electronic devices judged passing to a second test tray corresponding to said later process test unit, loading it into a later process test unit, ejecting said emptied first test tray, to the outside, and receiving an emptied second test tray received from the outside.

A test unit transporting a test tray carrying and transporting a plurality of electronic devices to the inside of the test unit and bringing said electronic devices into electrical contact with sockets on a test head side for an electrical test,

• said test unit comprising:
• a first transport route receiving said test tray loaded from the outside and performing an electrical test by said test unit;
• a second transport route receiving said test tray loaded from the outside and ejecting it to the outside without performing an electrical test by said test unit:
• and
• a loader unit receiving a test tray loaded into it and conducting an electrical test and an unloader unit unloading a test tray electrically tested at said test unit, wherein
• said second transport route is a route for conveying said test tray from said loader unit to said unloader unit,
• said second transport route is provided in its middle with an electronic device transporter for receiving said test tray from said loader unit and transferring said test tray with said unloader unit, and
• said electronic device transporter is provided with a temporary buffer device for temporarily storing electronic devices from pockets of said test tray carrying electronic devices or transports stored electronic devices to said pockets.

An electronic device test apparatus comprising:

• a test tray for carrying and transporting a plurality of electronic devices;
• a plurality of test units each including a test head side and transporting said test tray inside the test unit and bringing said electronic devices into electrical contact with sockets on the test head side for an electrical test;
• a self-propelled vehicle for loading and/or unloading a test tray between said plurality of test units;
• and
• a second intermediate conveyance unit for taking out to the outside of the process the electronic devices carried on said test tray, wherein
• said second intermediate conveyance unit is provided connected between a previous process test unit and a later process test unit, and
• said second intermediate conveyance unit receiving a first test tray unloaded from the previous process test unit, transporting at least electronic devices judged passing to a second test tray corresponding to said later process test unit, loading it into a later process test unit, ejecting said emptied first test tray, to the outside, and receiving an emptied second test tray received from the outside.