System and method for estimation of integrated circuit signal characteristics using optical measurements

A system for making electrical measurements using optical emissions, comprising:

• a position module, which determines the positions of devices to be tested on an integrated circuit;
• a radiation sensor/photodetector positionable in accordance with the position module:
• the radiation sensor/photodetector collects radiation emission information from the devices to be tested during electrical operation;
• an analysis module, which determines characteristic features of the radiation emission information between at least two devices and makes a measurement based upon separation distances between the characteristic features of the radiation emission information wherein the separation distance is compared with a model to determine the measurement.