Surface-potential distribution measuring apparatus, image carrier, and image forming apparatus
AssigneeRicoh Company, Ltd.
InventorHiroyuki Suhara
Life of this patent
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AssigneeRicoh Company, Ltd.
InventorHiroyuki Suhara
Estimating the term…
A surface-potential distribution measuring apparatus includes an electron gun, an electron-beam optical system, an electron-emission panel, a detector, and a control system. The electron-beam optical system is located between the electron gun and a sample, and focuses a beam of electrons emitted from the electron gun to the surface of the sample. The electron-emission panel is located near the sample to be collided with at least part of the electrons via the sample, and emits secondary electrons corresponding to the number of collided electrons. The detector detects at least part of the secondary electrons. The control system obtains potential distribution on the surface of the sample based on a detection result obtained by the detector.
A surface-potential distribution measuring apparatus that measures a potential distribution of a latent image on a surface of a sample by scanning the surface with a beam of charged particles, the surface-potential distribution measuring apparatus comprising:
A surface-potential distribution measuring apparatus that measures potential distribution on a surface of a sample by scanning the surface with a beam of charged particles, the surface-potential distribution measuring apparatus comprising:
Dependencies are inferred from the claim text.