Open-circuit testing system and method
AssigneeTest Research, Inc.
InventorsChien-Wei Chen, Chia-Ming Chen
Life of this patent
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Abstract
The invention discloses a testing system and method suitable for determining the connection state of an electronic component in an electronic device assembly. In an embodiment, the testing system comprises a signal sensing unit configured to provide a sensed signal induced by capacitive coupling in response to the output of a testing signal passing through a tested pin, a signal processor unit configured to filter and over-sample the sensed signal to obtain a digital signal, and an analyzer unit configured to compute the digital signal for determining a connection state of the test pin.
Claims13
A testing method for determining a connection state of an electronic component in an electronic device assembly, the method comprising:
- obtaining a sensed signal induced by capacitive coupling in response to the output of a testing signal passing through a tested pin of the electronic component;
- applying a signal processing sequence on the sensed signal, the processing sequence including:
- filtering and over-sampling the sensed signal to obtain a digital signal;
- and
- applying a validation test on the digital signal to determine whether the sensed signal is an acceptable measure, wherein the validation test is applied by computing the digital signal to determine a correspondence with a predetermined capacitive coupling reference;
- when a result of the validation test finds no correspondence with the predetermined capacitive coupling reference from the digital signal, raising a frequency and/or amplitude of the testing signal;
- when a correspondence with the predetermined capacitive coupling reference is found, converting the digital signal into frequency-domain spectrum data;
- and
- determining the connection state of the tested pin based on the frequency-domain spectrum data.
A testing system suitable for determining a connection state of an electronic component in an electronic device assembly, the testing system comprising:
- a signal sensing unit providing a sensed signal induced by capacitive coupling in response to the output of a testing signal passing through a tested pin of the electronic component;
- a signal processor unit filtering and over-sampling the sensed signal to obtain a digital signal;
- an analyzer unit applying a processing sequence on the sensed signal, wherein the processing sequence comprises:
- determining whether the sensed signal is an acceptable measure by computing the digital signal to determine a correspondence with a predetermined capacitive coupling reference;
- and
- when a correspondence with the predetermined capacitive coupling reference is found, computing frequency-domain spectrum data from the digital signal for determining a connection state of the tested pin;
- and
- a controller raising a frequency and/or amplitude of the testing signal when no correspondence with the predetermined capacitive coupling reference is found from the digital signal.
Dependencies are inferred from the claim text.