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US 7,612,551 B2Granted
System of phonon spectroscopy
AssigneeHoneywell International Inc.
InventorMihai N. Mihaila
Life of this patent
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Abstract
A system for phonon spectroscopy for attaining a phonon spectrum of a sample of a material. Current may be injected into the material to result in electrical noise in the material. The electrical noise may be processed to result in information revealing a phonon spectrum of the material. The phonon spectrum may be useful for analyzing and monitoring various features of the material. Other information about the material may be obtained from the electrical noise.
Claims17
A method of spectroscopy comprising:
- providing a material;
- measuring electrical noise of the material;
- determining information about the material from the electrical noise;
- and
- determining a second phonon spectrum of the material from a second parameter;
- and
- wherein:
- the electrical noise is a first parameter;
- the phonon spectrum from the first parameter is a first phonon spectrum;
- and
- the material is recognized by comparing the first phonon spectrum with the second phonon spectrum.
8 more elements
Dependencies are inferred from the claim text.