Method and apparatus for controlling topographical variation on a milled cross-section of a structure
AssigneeFEI Company
InventorsJames P. Nadeau, Pei Zou, Jason H. Arjavac
Life of this patent
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AssigneeFEI Company
InventorsJames P. Nadeau, Pei Zou, Jason H. Arjavac
Estimating the term…
An improved method of controlling topographical variations when milling a cross-section of a structure, which can be used to reduce topographical variation on a cross-section of a write-head in order to improve the accuracy of metrology applications. Topographical variation is reduced by using a protective layer that comprises a material having mill rates at higher incidence angles that closely approximate the mill rates of the structure at those higher incidence angles. Topographical variation can be intentionally introduced by using a protective layer that comprises a material having mill rates at higher incidence angles that do not closely approximate the mill rates of the structure at those higher incidence angles.
A method of exposing a planar cross-section of a structure composed of a first material, the method comprising:
A method of measuring a dimension of a cross-section of a structure composed of a first material, the method comprising:
A method of choosing a first material to be deposited as a protective layer on a structure composed of a second material prior to milling in order to control topological variation of a cross-section of said structure, the method comprising:
Dependencies are inferred from the claim text.