Differential input circuit with process variation and temperature compensation

Abstract

Systems with semiconductor devices that are DC-biased at either their weak inversion (i.e., sub-threshold) region or their strong inversion region. In a preferred embodiment using semiconductor devices (e.g., NMOS, PMOS, etc.), a gate to source voltage (Vgs) is slightly below the threshold voltage (Vtn) of the device. These weakly turned-on semiconductor devices increase the receiving AC sensitivity of an AM-Detector compared to that of a conventional AM-Detector without any DC-biasing. Further, the compensating bias voltage (Vbias) compensates for one or both of the ambient temperature change and the foundry's process variation of the various semiconductor devices.

Dependencies are inferred from the claim text.