Measurement stand for holding a measuring instrument

A measurement stand for holding a measuring device for measuring the thickness of thin layers, said measurement stand comprising a housing in which a cam follower is guided such that it is moved up and down and the measuring device is arranged at that end of said cam follower that faces the measuring object, characterized in that a drive unit with an electric drive drives the lifting movement of the cam follower, wherein said drive unit initiates in the down movement at least one first movement phase with a rapid motion and then at least one further movement phase with a creep motion of the cam follower until the measuring device touches down on the measuring object, wherein the drive unit comprises a cam disk which moves a pivoted lever up and down, said pivoted lever being arranged stationary in relation to the housing at one of its ends and forming a pivoted connection with the cam follower at its other end, and a roller running off the cam disk is provided between the pivot of the pivoted lever and the pivoted connection to the cam follower, wherein said pivot is stationary in relation to the housing, and wherein the cam disk is defined by a first curve trace for the first movement phase with a rapid motion and by a second curve trace that differs from the first curve trace for a further movement in the creep motion.