Method for enhancing the measurement capability of multi-parameter inspection systems
AssigneeIndustrial Technology Research Institute
InventorsChun Hung Ko, Yi Sha Kuo, Chung Chu Chang
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AssigneeIndustrial Technology Research Institute
InventorsChun Hung Ko, Yi Sha Kuo, Chung Chu Chang
Estimating the term…
A method for improving the measurement capability of multi-parameter inspection systems includes performing a measuring procedure to acquire a measured signature of a sample, calculating weighting factors representing a correlation between structural parameters of the sample by using a weighting algorithm, transforming the weighting factors into a sampling function by using a transforming rule, updating the measured signature to form an updated measured signature and generating a plurality of updated nominal signatures according to the sampling function, and comparing the updated measured signature and the updated nominal signatures to determine the structural parameters of the sample.
A method for enhancing the measurement capability of multi-parameter inspection systems, comprising:
A method for enhancing the measurement capability of multi-parameter inspection systems, comprising:
A multi-parameter inspection system, comprising:
Dependencies are inferred from the claim text.