Method for estimating scattered ray intensity in X-ray CT and X-ray CT apparatus
AssigneesKabushiki Kaisha Toshiba, Toshiba Medical Systems Corporation
InventorsYosuke Okamoto, Naruomi Akino
Life of this patent
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Abstract
A method for estimating a scattered ray intensity distribution in an X-ray CT apparatus, the method includes: irradiating a subject with X-rays; and configuring a cross-sectional image of the subject by detecting the X-rays passing through the subject, on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject and an X-ray scattering probability of the subject, intensity of the scattered ray being calculated.
Claims20
A method for estimating a scattered ray intensity distribution in an X-ray CT apparatus, the method comprising:
- irradiating a subject with X-rays;
- and
- configuring a cross-sectional image of the subject by detecting the X-rays passing through the subject,
- on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject and an X-ray scattering probability of the subject, intensity of the scattered ray being calculated.
An X-ray CT apparatus comprising:
- a first X-ray generation section configured to generate X-rays;
- an X-ray detection section configured to detect the X-rays passing through a subject;
- an image reconfiguration section configured to configure a cross-sectional image of the subject on the basis of results detected by the X-ray detection section;
- and
- a scattered ray calculation section configured to estimate a scattered ray intensity distribution of the X-rays in the subject,
- the scattered ray calculation section estimating the scattered ray intensity distribution by calculating the intensity of the scattered ray on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject and an X-ray scattering probability of the subject, and
- the image reconfiguration section reconfiguring the cross-sectional image by correcting the results detected by the X-ray detection section using the scattered ray intensity distribution estimated by the scattered ray calculation section.
Dependencies are inferred from the claim text.