On-chip signal waveform measurement apparatus for measuring signal waveforms at detection points on IC chip
AssigneeSemiconductor Technology Academic Research Center
InventorMakoto Nagata
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AssigneeSemiconductor Technology Academic Research Center
InventorMakoto Nagata
Estimating the term…
An on-chip signal waveform measurement apparatus mounted on an IC chip measures signal waveforms at detection points on the IC chip. A reference voltage generator successively generates reference voltages different from each other based on a predetermined timing signal, and Signal probing front-end circuits are mounted to correspond to the detection points, respectively, and each buffer-amplifies a voltage at each detection point, compares the buffer-amplified voltage with each reference voltage, and digitizes a comparison result into a binary digital output signal. A multiplexer time-division-multiplexes the binary digital output signals from the signal probing front-end circuits. A data processing unit calculates a judgment output probability for a detected voltage at each detection point detected by the respective signal probing front-end circuits, by counting a number of times of a predetermined binary value of the multiplexed binary digital output signal.
A sampling timing signal generator for generating an enable timing control signal based on a predetermined system clock signal and a predetermined master clock signal, said sampling timing signal generator comprising:
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