Testing system and method for testing an electronic device

A testing method capable of being implemented by a testing system for measuring an electronic device, the testing method comprising:

• generating a control signal by a main controller of the testing system;
• generating a test input signal by a signal generator of the testing system according to the control signal;
• generating a switching signal by the signal generator of the testing system to control switching actions of switches of the testing system according to the control signal;
• outputting the test input signal through a test port of the testing system to the electronic device;
• processing test result signals corresponding to the test input signal from the electronic device and outputting a result data by an instrument unit of the testing system;
• and
• computing the result data to determine whether the result data is within a predetermined range by the main controller.

A testing system for testing an electronic device, the electronic device capable of being operated in an external power mode and a battery power mode, the testing system comprising:

• a main controller configured to generate a control signal in response to a test request;
• a signal generator operatively coupled to the main controller, the signal generator configured to generate a first set of test signals corresponding to the external power mode of the electronic device and a second set of test signals corresponding to the battery power mode of the electronic device according to the control signal received from the main controller;
• and
• a testing port coupled between the signal generator and the electronic device for selectively transmitting the first set of test signals to the electronic device to test the electronic device under the external power mode and the second set of test signals to the electronic device to test the electronic device under the battery power mode.