Contact pusher, contact arm, and electronic device handling apparatus
AssigneeAdvantest Corporation
InventorsAyumu Mizushima, Jun Ogura
Life of this patent
Estimating the term…
Abstract
A contact pusher attached to the front end of a contact arm bringing an IC device into contact with a contact part of a test head and pushing the IC device is provided with a suction pad for picking up and holding an IC device, a first press part for pushing against a package of an IC device, a second press part for pushing against terminals of the IC device, and a base part for conducting heat to the first press part, the first press part and the base part contacting each other and the first press part provided to be able to finely move relative to the base part.
Claims8
A contact pusher configured to be attached to a front end of a contact arm, the contact pusher being configured to bring an electronic device under test into contact with a contact part of a test head by pushing against the electronic device under test, the contact pusher comprising:
- a holder configured to hold the electronic device under test;
- an elastic member;
- a first contactor configured to contact a body of the electronic device under test;
- and
- a thermal conductor configured to conduct heat to the first contactor, wherein
- the first contactor and the thermal conductor contact each other so as to conduct heat, the first contactor is configured to move in a direction to push against the electronic device under test,
- the first contactor is segmented to provide a plurality of contact portions, each of the contact portions contacting a surface of the body of the electronic device under test simultaneously, and
- the elastic member is configured to bias the contact portions in a direction substantially parallel to the surface of the electronic device under test.
A contact pusher configured to be attached to a front end of a contact arm, the contact pusher being configured to bring an electronic device under test into contact with a contact part of a test head by pushing against the electronic device under test, the contact pusher comprising:
- a holder configured to hold the electronic device under test;
- an attracting member;
- a first contactor configured to contact a body of the electronic device under test;
- and
- a thermal conductor configured to conduct heat to the first contactor, wherein:
- the first contactor and the thermal conductor contact each other so as to conduct heat, the first contactor is configured to move in a direction to push against the electronic device under test,
- the first contactor is segmented to provide a plurality of contact portions, each of the contact portions contacting a surface of the body of the electronic device under test simultaneously, and
- the attracting member is configured to attract the contact portions in a direction generally parallel to the surface of the electronic device under test.
Dependencies are inferred from the claim text.