Specimen testing element, specimen information obtaining method and specimen testing apparatus

A specimen testing element for obtaining information on a specimen by utilizing a change in the propagation state of an electromagnetic wave propagating through a transmission path due to an existence of the specimen, the electromagnetic wave having an appropriate band in a frequency range of 30 GHz to 30 THz, comprising:

• a plurality of holding portions, capable of holding a specimen, being arranged substantially in a predetermined mode of regularity to form a periodic structure having a wavelength selectivity attributable to a photonic band gap or a photonic fractal structure in part of a region in the transmission path where the propagating electromagnetic wave exists,
• wherein the transmission path has at least one conductor and a dielectric material and the plurality of holding portions are formed in the dielectric material, while the at least one conductor is formed to adhere to a surface of the dielectric material at least in order to confine the electromagnetic field to the sites where the plurality of holding portions exist.