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US 7,608,541 B2Granted
Method of forming fine pattern, liquid crystal display device having a fine pattern and fabricating method thereof
AssigneeLG Display Co., Ltd.
InventorsSoon Sung Yoo, Heung Lyul Cho
Life of this patent
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Abstract
A method of forming fine pattern includes providing a film, forming a photo-resist pattern on the film, ashing the photo-resist pattern and patterning the film by using the ashed photo-resist pattern as a mask.
Claims32
A method of forming a fine pattern, comprising:
- providing a film;
- forming a photo-resist pattern on the film;
- ashing the photo-resist pattern, wherein the ashing process is performed under O2 and at least one of SF6 and CF4 gas environment;
- and
- patterning the film by using the ashed photo-resist pattern as a mask.
2 more elements
A method of forming a fine pattern, comprising:
- forming a photo-resist pattern using a mask to form a first pattern having a first line width corresponding to an exposure resolution of the mask;
- ashing the photo-resist pattern to have a second pattern with a second line width narrower than the first line width, wherein the ashing process is performed by O2 and at least one of SF6 and CF4 gas environment;
- and
- patterning a film by using the ashed photo-resist pattern as a mask to form a third pattern with a third line width narrower than the second line width.
1 more element
A method of fabricating at least one portion of the pixel electrode and the common electrode on a substrate for a liquid crystal display device comprising:
- forming a conductive layer;
- forming a photo-resist pattern using a mask to form a first pattern having a first line width corresponding to an exposure resolution of the mask;
- ashing the photo-resist pattern, wherein the ashing process is performed under O2 and at least one of SF6 and CF4 gas environment;
- and
- patterning the conductive layer using the ashed photo-resist pattern as a mask to form the one portion having a second line width narrower than the first line width.
2 more elements
Dependencies are inferred from the claim text.