Method of analyzing electrical connection and test system
AssigneeDelphi Technologies, Inc.
InventorsBrian Lee Chandler, Frederick F. Kuhlman
Life of this patent
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AssigneeDelphi Technologies, Inc.
InventorsBrian Lee Chandler, Frederick F. Kuhlman
Estimating the term…
A test system and method of analyzing a pin to circuit connection on a substrate is provided. The method includes applying thermal energy to the pin or the substrate at a location outside of the pin to circuit interface, and measuring infrared radiation near the pin to circuit interface. The method also includes the step of analyzing the measured infrared radiation to determine thermal energy distribution near the pin to circuit interface resulting from thermal conductivity at the interface. The method further includes the step of determining sufficiency of the pin to circuit electrical and mechanical connection based on the determined thermal energy distribution.
A method of determining quality of an electrical connection of a pin connected to a circuit at an interface on a substrate of an electrical assembly, said method comprising the steps of:
A method of determining quality of an electrical connection of a compliant press-fit pin inserted into a conductive receptacle at an interface on a substrate of an electrical assembly, said method comprising the steps of:
A test system for determining quality of an electrical connection between a pin and a circuit at an interface on a substrate, said test system comprising:
Dependencies are inferred from the claim text.