Factory-alignable compact cantilever probe

A probe comprising a structure for passing and focusing radiation beams, a cantilevered member attached to said structure for probing a specimen as said cantilevered member is rastered over the specimen, a reflective surface on said cantilevered member, a beam emitter attached to said structure to emit radiation beams for passage through said structure to said reflective surface, and a radiation beam detector attached to said structure, said structure adapted to focus radiation beams from said beam emitter to said reflective surface and from said reflective surface to said beam detector, the probe further comprising a support attached to said structure for supporting said cantilevered member, a protrusion on one of said support and said structure, and a cavity in the other of said support and said structure, said protrusion received in said cavity.

A probe comprising a structure for passing and focusing radiation beams, a cantilevered member attached to said structure for probing a specimen as said cantilevered member is rastered over the specimen, a reflective surface on said cantilevered member, a beam emitter attached to said structure to emit radiation beams for passage through said structure to said reflective surface, and a radiation beam detector attached to said structure, said structure adapted to focus radiation beams from said beam emitter to said reflective surface and from said reflective surface to said beam detector, the probe further comprising a support attached to said structure for supporting said cantilevered member and having a cavity therein, a protrusion on said structure and received in said cavity.

A probe comprising a structure for passing and focusing radiation beams, a cantilevered member attached to said structure for probing a specimen as said cantilevered member is rastered over the specimen, a reflective surface on said cantilevered member, a beam emitter attached to said structure to emit radiation beams for passage through said structure to said reflective surface, and a radiation beam detector attached to said structure, said structure adapted to focus radiation beams from said beam emitter to said reflective surface and from said reflective surface to said beam detector, the probe further comprising a gimbaled structure attached to said beam passing and focusing structure for effecting swinging movements thereof in orthogonal directions for rastering said cantilevered member over the specimen, said gimbaled structure comprising an inner and a middle member connected by a first pair of co-axial torsion bars for effecting swinging movements of said beam passing and focusing structure in one of the orthogonal directions and further comprising an outer member connected to said middle member by a second pair of co-axial torsion bars for effecting swinging movements of said beam passing and focusing structure in an other of the orthogonal directions.

A probe comprising a structure for passing and focusing radiation beams, a cantilevered member attached to said structure for probing a specimen as said cantilevered member is rastered over the specimen, a reflective surface on said cantilevered member, a beam emitter attached to said structure to emit radiation beams for passage through said structure to said reflective surface, and a radiation beam detector attached to said structure, said structure adapted to focus radiation beams from said beam emitter to said reflective surface and from said reflective surface to said beam detector, the probe further comprising a member attached to said beam passing and focusing structure, structure for supporting said member, said member hingedly connected to said supporting structure to move hingedly in orthogonal directions for effecting swinging movements of said beam passing and focusing structure in the orthogonal directions, and at least one device for effecting the movements hingedly of said member.

A probe comprising a structure for passing and focusing radiation beams, a cantilevered member attached to said structure for probing a specimen as said cantilevered member is rastered over the specimen, a reflective surface on said cantilevered member, a beam emitter attached to said structure to emit radiation beams for passage through said structure to said reflective surface, and a radiation beam detector attached to said structure, said structure adapted to focus radiation beams from said beam emitter to said reflective surface and from said reflective surface to said beam detector, the probe further comprising a member composed of an insulative material attached to said structure, said beam emitter and said beam detector attached to said member, wires evaporated on said member and connected to said beam emitter and said beam detector for carrying signals and/or power.

In combination with a supporting structure, a cantilevered member for probing a specimen and for reflecting beams to a beam detector to indicate probe position, a support attached to said supporting structure for supporting said cantilevered member, a protrusion on one of said support and said supporting structure, a cavity in the other of said support and said supporting structure for receiving said protrusion, said protrusion being attached to said other of said support and said supporting structure, the combination further comprising a thermoplastic adhesive attaching said protrusion within said cavity.